Technical Improvements of Scanning Electron Microscope Methods in Document Examination

• NCJ Number: 92527
• Journal: Forensic Science International Volume: 22 Issue: 2/3 Dated: (August/September 1983) Pages: 265-278
• Author(s): P E Baier
• Date Published: 1983
• Length: 14 pages
• Publication Format: Article
• Language: English
• Country: Ireland
• Note: Paper presented at the fortieth meeting of the American Society of Questioned Document Examiners, Boston, 1982

Annotation

The article describes briefly the technical facts, problems and improvements related to the Scanning Electron Microscope.

Abstract

Photographs of various stroke crossings and erasured areas are shown. (Publisher abstract)