Application of Static Secondary Ion Mass Spectrometry to Trace Evidence Analysis

• NCJ Number: 181045
• Author(s): Gary S. Groenewold; Garold L. Gresham; Recep Avci
• Date Published: 1999
• Length: 107 pages
• Grant Number(s): 97-IJ-CX-A050
• Sponsoring Agency: National Institute of Justice (NIJ)
• Corporate Author: Idaho National Engineering Laboratory
• Sale Source: National Institute of Justice/NCJRS; NCJRS Photocopy Services
• Publication Format: Document
• Publication Type: Report (Technical)
• Language: English
• Country: United States of America
• Note: Project Number 7-9192-ID-IJ, Non-Technical Summary Included

Annotation

This study assesses the efficacy of static secondary ion mass spectrometry (SIMS) for providing highly specific chemical characterization of trace evidence samples.

Abstract

Samples coated with automotive paint and with nail polishes could be distinguished on the basis of their SIMS spectra, provided the data were reduced using multivariate analysis techniques. Hair samples could be readily characterized in terms of the consumer chemicals present on the surface, namely soap and softener chemicals. Heroin and cocaine could be readily detected on fiber surfaces using SIMS. The study describes methods for analyzing hair and fiber samples. The SIMS technique has the potential to provide a chemical-specific characterization for a variety of trace evidence characterizations. Use of the technique is limited by the high cost of instrumentation and data interpretation and by the level of expertise required for routine operation. Figures, tables, references