Use of a Silicon Carbide Sampling Accessory for the Diffuse Reflectance Infrared Fourier Transform Analysis of Samples of Interest to Forensic Science

• NCJ Number: 128918
• Journal: Journal of Forensic Sciences Volume: 36 Issue: 2 Dated: (March 1991) Pages: 556-564
• Author(s): W D Mazzella; C J Lennard
• Date Published: 1991
• Length: 9 pages
• Publication Format: Article
• Publication Type: Research (Applied/Empirical)
• Language: English
• Country: United States of America

Annotation

An infrared spectroscopy method is described which requires little sample preparation and may be used for analysis of a wide range of samples of interest to forensic science.

Abstract

A small quantity of a sample is rubbed onto an abrasive silicon carbide disk, which is then measured by diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS). The technique has been successfully applied to the infrared analysis of paint, synthetic rubber, cosmetics, corrector fluid, and adhesives. 7 figures and 8 references (Author abstract)