Analysis of mutations in father-son pairs with 17 Y-STR loci

• NCJ Number: 308322
• Journal: Forensic Science International - Genetics Volume: Online Dated: 2007
• Author(s): Amy E. Decker; Margaret C. Kline; Janette W. Redman; Thomas M. Reid; John M. Butler
• Date Published: 2007
• Grant Number(s): 2003-IJ-R-029
• Sponsoring Agency: National Institute of Justice (NIJ)
• Corporate Author: National Institute of Standards and Technology (NIST)
• Publication Format: Article
• Publication Type: Research (Applied/Empirical)
• Language: English
• Country: United States of America

Annotation

This paper reports on an examination of father-son sample pairs to identify mutations using the 17 Y-STR loci in the Yfiler™ kit, with a discussion of research results.

Abstract

The authors have examined 389 father-son sample pairs from U.S. Caucasians, African Americans, Hispanics, and Asians using the 17 Y-STR loci in the Yfiler™ kit and observed a total of 24 differences between father and son. Thirteen mutations resulted in the gain of a repeat in the son and 11 resulted in a loss of a repeat. All samples resulted in single repeat mutations except one sample which contained a two-repeat loss at Y-GATA-H4. Furthermore, two different sample pairs were found to have two mutations. An African American sample pair had a mutation at DYS458 and a second at DYS635 and an Asian sample pair had mutations at DYS439 and Y-GATA-H4. (Published Abstracts Provided)