NCJ Number
415
Journal
Analytical Chemistry Volume: 42 Issue: 12 Dated: OCTOBER 1970 Pages: 1399-1402
Date Published
1970
Length
4 pages
Annotation
THE POSITION OF THE RF SPARK WITH RESPECT TO THE ENTRANCE SLIT IN SPARK SOURCE MASS SPECTROMETRY IS DISCUSSED.
Abstract
THIS POSITION AFFECTS RESOLUTION, LINE INTENSITY, AND RELATIVE SENSITIVITY. LINES ARE SHOWN QUANTITATIVELY TO BE SHARPER AT LONGER SPARK TO SLIT DISTANCES. LINE INTENSITIES VARY WITH THIS PARAMETER. RELATIVE SENSITIVITY FACTORS IN COPPER, ALUMINUM, AND STEEL MATRICES ARE DEPENDENT UPON SPARK POSITION. ION PROFILES AS A FUNCTION OF THE Y-DEFLECTOR VOLTAGE ARE SHOWN FOR +1 THROUGH +5 IONS OF COPPER.
Date Published: January 1, 1970
Downloads
Similar Publications
- Cognitive and contextual influences in determination of latent fingerprint suitability for identification judgments
- Two-Stage Approach for the Inference of the Source of High-Dimension and Complex Chemical Data in Forensic Science
- Just Science Podcast: Just Forensic Podiatry Supporting Investigations